SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors. - Javier Martín-Martínez; Esteve Amat; M. B. González; P. Verheyen; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; Eddy Simoen (Microelectron. Reliab., 2010)