A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation. - Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Antonio Toro-Frías; Rafael Castro-López; Javier Martín-Martínez; Elisenda Roca; Rosana Rodríguez; Francisco V. Fernández 001; Montserrat Nafría (SMACD, 2018)

Automated Massive RTN Characterization Using a Transistor Array Chip. - Pablo Saraza-Canflanca; Javier Diaz-Fortuny; Antonio Toro-Frías; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2018)

Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models. - Pablo Saraza-Canflanca; D. Malagon; Fábio Passos; A. Toro; Juan Núñez 002; Javier Diaz-Fortuny; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2018)

New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors. - Pablo Saraza-Canflanca; Javier Diaz-Fortuny; Rafael Castro-López; Elisenda Roca Moreno; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (DATE, 2019)

Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator. - Antonio Toro-Frías; Pablo Saraza-Canflanca; Fábio Passos; Pablo Martín-Lloret; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (DATE, 2019)

A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices. - G. Pedreira; Javier Martín-Martínez; Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Rosana Rodríguez; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Montserrat Nafría (IRPS, 2019)

TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level. - Pablo Saraza-Canflanca; Javier Diaz-Fortuny; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2019)

Improving the reliability of SRAM-based PUFs in the presence of aging. - Pablo Saraza-Canflanca; Héctor Carrasco-Lopez; Piedad Brox; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (DTIS, 2020)

A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level. - Pablo Saraza-Canflanca; Javier Diaz-Fortuny; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (Integr., 2020)

Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits. - Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Francisco V. Fernández 001; Montserrat Nafría (IEEE Trans. Instrum. Meas., 2020)

A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability. - Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Erik Bury; Michiel Vandemaele; Ben Kaczer; Robin Degraeve (IRPS, 2022)

A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies. - Pablo Saraza-Canflanca; Héctor Carrasco-Lopez; Andrés Santana-Andreo; Javier Diaz-Fortuny; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (IRPS, 2022)

A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation. - Pablo Saraza-Canflanca; Javier Martín-Martínez; Elisenda Roca; Rafael Castro-López; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2022)

A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs. - Andrés Santana-Andreo; Pablo Saraza-Canflanca; Héctor Carrasco-Lopez; Piedad Brox; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (Integr., 2022)

On the Impact of the Biasing History on the Characterization of Random Telegraph Noise. - Pablo Saraza-Canflanca; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (IEEE Trans. Instrum. Meas., 2022)

Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation. - Javier Diaz-Fortuny; Dishant Sangani; Pablo Saraza-Canflanca; Erik Bury; Robin Degraeve; Ben Kaczer (IRPS, 2023)

Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability. - Javier Martín-Martínez; Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Rosana Rodríguez; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Montserrat Nafría (IRPS, 2023)

Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology. - Pablo Saraza-Canflanca; Javier Diaz-Fortuny; Andrea Vici; Erik Bury; Robin Degraeve; Ben Kaczer (IRPS, 2023)

Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices. - Francisco V. Fernández 001; Elisenda Roca; Pablo Saraza-Canflanca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Rafael Castro-López (SMACD, 2023)

A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array. - Andrés Santana-Andreo; Pablo Saraza-Canflanca; Héctor Carrasco-Lopez; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (SMACD, 2023)

Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology. - Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Alex Romano-Molar; Erik Bury; Robin Degraeve; Ben Kaczer (IRPS, 2024)

Exploiting Bias Temperature Instability for Reservoir Computing in Edge Artificial Intelligence Applications. - Y. Guo; Robin Degraeve; Michiel Vandemaele; Pablo Saraza-Canflanca; Jacopo Franco; Ben Kaczer; Erik Bury; Ingrid Verbauwhede (IRPS, 2024)

Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays. - Pablo Saraza-Canflanca; Dishant Sangani; Javier Diaz-Fortuny; Stanislav Tyaginov; Georges G. E. Gielen; Erik Bury; Ben Kaczer (IRPS, 2024)

Effects of Temperature and Device-to-Device Variability in pFET-Based Bias Temperature Instability Reservoir Computing. - Yuanyang Guo; Robin Degraeve; Pablo Saraza-Canflanca; Ben Kaczer; Erik Bury; Ingrid Verbauwhede (IRPS, 2025)

Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework. - Yusuke Higashi; Anirudh Varanasi; Philippe J. Roussel; Pablo Saraza-Canflanca; J. P. Bastos; Alexander Grill; E. Catapano; R. Asanovski; Jacopo Franco; Ben Kaczer; Adrian Chasin; Devin Verreck; et al. (IRPS, 2025)