Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. - Edward I. Cole Jr.; Jerry M. Soden; Paiboon Tangyunyong; Patrick L. Candelaria; Richard W. Beegle; Daniel L. Barton; Christopher L. Henderson; Charles F. Hawkins (ITC, 1997)

Thermal modeling of localized laser heating in multi-level interconnects. - Paiboon Tangyunyong (Microelectron. Reliab., 2003)