Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. - M. L. Bourqui; Laurent Béchou; Olivier Gilard; Yannick Deshayes; Pamela Del Vecchio; L. S. How; F. Rosala; Yves Ousten; André Touboul (Microelectron. Reliab., 2008)

Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes. - Pamela Del Vecchio; Arnaud Curutchet; Yannick Deshayes; M. Bettiati; F. Laruelle; Nathalie Labat; Laurent Béchou (Microelectron. Reliab., 2015)