Beyond Labels: Data-Efficient Wafer Yield Prediction with TabESA. - Pang Guo; Yining Chen (ASP-DAC, 2026)

REDM: Regression-Guided Diffusion Modeling for Universal Soft Sensor Enhancement in Semiconductor Process Control. - Weiping Xie; Yumeng Shi; Pang Guo; Yining Chen 001 (ASP-DAC, 2026)

AMBCT: Adaptive multi-view Bayesian co-training for semi-supervised virtual metrology. - Jiangchen Wu; Fangke Chen; Pang Guo; Yuping Wang; Weiping Xie; Yining Chen 001; Dawei Gao (Expert Syst. Appl., 2026)

A survey on semiconductor wafer yield prediction by artificial intelligence. - Dongyan Zhao 002; Yining Chen 001; Pang Guo; Fangke Chen; Ruyue Jing; Xin Xu; Yanning Chen; Fang Liu; Bo Wu (Microelectron. J., 2026)