Automated test generation for post silicon microcontroller validation. - Pankaj Moharikar; Jayakrishna Guddeti (HLDVT, 2017)

Method to Generate Bus Stress Pattern Using iBUS(Infineon Bus Under Stress) framework. - Sooraj Ravindrakumar; Vaishnavi J; Jayakrishna Guddeti; Pankaj Moharikar (MECO, 2023)