Analysis of the influence of spatially localized oxide traps on the capacitance of MIS tunnel diodes. - Andrea Nannini; Paolo Emilio Bagnoli (Eur. Trans. Telecommun., 1990)

Validation of the DJOSER analytical thermal simulator for electronic power devices and assembling structures. - Paolo Emilio Bagnoli; Carlo Bartoli; Fabio Stefani (Microelectron. J., 2007)

Electro-thermal simulation of metal interconnections under high current flow. - Paolo Emilio Bagnoli; Yabin Zhang 003 (Microelectron. Reliab., 2010)

A modeling methodology for thermal analysis of the PCB structure. - Yabin Zhang 003; Paolo Emilio Bagnoli (Microelectron. J., 2014)