Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics. - Paolo Magnone; Calogero Pace; Felice Crupi; Gino Giusi (Microelectron. Reliab., 2007)

Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks. - Paolo Srinivasan; Felice Crupi; Eddy Simoen; Paolo Magnone; Calogero Pace; Durga Misra; Cor Claeys (Microelectron. Reliab., 2007)

Full Model and Characterization of Noise in Operational Amplifier. - Gino Giusi; Felice Crupi; Calogero Pace; Paolo Magnone (IEEE Trans. Circuits Syst. I Regul. Pap., 2009)

Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits. - Paolo Magnone; Felice Crupi; Massimo Alioto; Ben Kaczer (ISCAS, 2010)

Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling. - Felice Crupi; Massimo Alioto; Jacopo Franco; Paolo Magnone; Ben Kaczer; Guido Groeseneken; Jérôme Mitard; Liesbeth Witters; Thomas Y. Hoffmann (ISCAS, 2011)

Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements. - Paolo Magnone; Felice Crupi; Massimo Alioto; Ben Kaczer; Brice De Jaeger (IEEE Trans. Very Large Scale Integr. Syst., 2011)

A methodology to account for the finger interruptions in solar cell performance. - Raffaele De Rose; Antonio Malomo; Paolo Magnone; Felice Crupi; Giorgio Cellere; Marco Martire; Diego Tonini; Enrico Sangiorgi (Microelectron. Reliab., 2012)

Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements. - Felice Crupi; Massimo Alioto; Jacopo Franco; Paolo Magnone; Mitsuhiro Togo; N. Horiguchi; Guido Groeseneken (IEEE Trans. Circuits Syst. II Express Briefs, 2012)

Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling. - Felice Crupi; Massimo Alioto; Jacopo Franco; Paolo Magnone; Ben Kaczer; Guido Groeseneken; Jérôme Mitard; Liesbeth Witters; Thomas Y. Hoffmann (IEEE Trans. Very Large Scale Integr. Syst., 2012)

Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide. - Andrea Natale Tallarico; Susanna Reggiani; Paolo Magnone; Giuseppe Croce; Riccardo Depetro; P. Gattari; Enrico Sangiorgi; Claudio Fiegna (Microelectron. Reliab., 2017)

Plug and Play DC-DC Converters for Smart DC Nanogrids with Advanced Control Ancillary Services. - Guangyuan Liu; Aram Khodamoradi; Paolo Mattavelli; Tommaso Caldognetto; Paolo Magnone (CAMAD, 2018)

Investigation of degradation mechanisms in low-voltage p-channel power MOSFETs under High Temperature Gate Bias stress. - Paolo Magnone; Giacomo Barletta; A. Magrì (Microelectron. Reliab., 2018)

Performance improvement of pulse width-amplitude modulation-based quasi-Z-source inverters: Analysis and implementation. - Mohammad Mohammadi 003; Afshin Mirzaee; Paolo Magnone; Javad Shokrollahi Moghani; Paolo Mattavelli (Int. J. Circuit Theory Appl., 2020)

Suppression of Second-Order Harmonic Current for Droop-Controlled Distributed Energy Resource Converters in DC Microgrids. - Guangyuan Liu; Tommaso Caldognetto; Paolo Mattavelli; Paolo Magnone (IEEE Trans. Ind. Electron., 2020)

Experimental analysis of variability in WS2-based devices for hardware security. - Massimo Vatalaro; H. Neill; F. Gity; Paolo Magnone; Vincenzo Maccaronio; C. Márquez; J. C. Galdon; F. Gamiz; Felice Crupi; P. Hurley; Raffaele De Rose (CoRR, 2023)