Sensitivity of reliability growth models to operational profile errors. - Adalberto Nobiato Crespo; Paolo Matrella; Alberto Pasquini (ISSRE, 1996)

Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]. - Alberto Pasquini; Adalberto Nobiato Crespo; Paolo Matrella (IEEE Trans. Reliab., 1996)