Automated test equipment for research on nonvolatile memories. - Paolo Pellati; Piero Olivo (IEEE Trans. Instrum. Meas., 2001)

Overerase phenomena: an insight into flash memory reliability. - Andrea Chimenton; Paolo Pellati; Piero Olivo (Proc. IEEE, 2003)

Automated characterization of TAS-MRAM test arrays. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Paolo Pellati; Michele Ramponi; Jérémy Alvarez-Herault; Ken Mackay (DTIS, 2015)

An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Paolo Pellati; Michele Ramponi; Christian Wenger; Jérémy Alvarez-Herault; Ken Mackay (IEEE Trans. Emerg. Top. Comput., 2018)