A new test structure for recombination measurements in thin si layers for VLSI structures. - Salvatore Bellone; Paolo Spirito (Eur. Trans. Telecommun., 1990)

Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching. - E. D'Arcangelo; Andrea Irace; Giovanni Breglio; Paolo Spirito (Microelectron. Reliab., 2004)

Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. - Andrea Irace; Giovanni Breglio; Paolo Spirito; Romeo Letor; Sebastiano Russo (Microelectron. Reliab., 2005)

Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode. - Andrea Irace; Giovanni Breglio; Paolo Spirito; A. Bricconi; Diego Raffo; Luigi Merlin (Microelectron. Reliab., 2006)

Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. - Giovanni Breglio; Andrea Irace; Ettore Napoli; Paolo Spirito; Kimimori Hamada; T. Nishijima; T. Ueta (Microelectron. Reliab., 2007)

New developments of THERMOS3, a tool for 3D electro-thermal simulation of smart power MOSFETs. - Andrea Irace; Giovanni Breglio; Paolo Spirito (Microelectron. Reliab., 2007)

Detection of localized UIS failure on IGBTs with the aid of lock-in thermography. - Giovanni Breglio; Andrea Irace; Ettore Napoli; Michele Riccio; Paolo Spirito; Kimimori Hamada; T. Nishijima; T. Ueta (Microelectron. Reliab., 2008)

1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention. - Lucio Rossi; Michele Riccio; Ettore Napoli; Andrea Irace; Giovanni Breglio; Paolo Spirito (Microelectron. Reliab., 2009)

Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography. - Michele Riccio; Lucio Rossi; Andrea Irace; Ettore Napoli; Giovanni Breglio; Paolo Spirito; Ryuzo Tagami; Yoshihito Mizuno (Microelectron. Reliab., 2010)

A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing. - Lucio Rossi; Michele Riccio; Ettore Napoli; Andrea Irace; Giovanni Breglio; Paolo Spirito (Microelectron. Reliab., 2010)

3D electro-thermal simulations of wide area power devices operating in avalanche condition. - Michele Riccio; Giuseppe De Falco; Luca Maresca; Giovanni Breglio; Ettore Napoli; Andrea Irace; Yohei Iwahashi; Paolo Spirito (Microelectron. Reliab., 2012)

An Experimental Power-Lines Model for Digital ASICs Based on Transmission Lines. - Maurizio Costagliola; Davide De Caro; Antonio Girardi; Roberto Izzi; Niccolò Rinaldi; Marco Spirito; Paolo Spirito (IEEE Trans. Very Large Scale Integr. Syst., 2012)