Migration issues in sintered-silver die attaches operating at high temperature. - Raphel Riva; Cyril Buttay; Bruno Allard; Pascal Bevilacqua (Microelectron. Reliab., 2013)

Test bench and data analysis towards an on-line Health Monitoring for emerging power modules. - Malorie Hologne; Pascal Bevilacqua; Bruno Allard; Guy Clerc; Hubert Razik (IECON, 2018)

A Study on Shunt Resistor-based Current Measurements for Fast Switching GaN Devices. - Thilini Wickramasinghe; Stephane Azzopardi; Bruno Allard; Cyril Buttay; Charles Joubert; Christian Martin 003; Jean-François Mogniotte; Hervé Morel; Pascal Bevilacqua; Thanh-Long Le (IECON, 2019)

Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs. - Oriol Avino-Salvado; Cyril Buttay; Ferran Bonet; Christophe Raynaud; Pascal Bevilacqua; José Rebollo; Hervé Morel; Xavier Perpiñà (IEEE Trans. Ind. Electron., 2024)