Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities. - Christelle Bénard; Gaëtan Math; Pascal Fornara; Jean-Luc Ogier; Didier Goguenheim (Microelectron. Reliab., 2009)

Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. - Y. Joly; L. Truphemus; Laurent Lopez; Jean-Michel Portal; Hassen Aziza; Franck Julien; Pascal Fornara (ISCAS, 2011)

Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. - Y. Joly; Laurent Lopez; Jean-Michel Portal; Hassen Aziza; Jean-Luc Ogier; Y. Bert; Franck Julien; Pascal Fornara (Microelectron. Reliab., 2011)

Robust design of thermo-mechanical MEMS switch embedded in aluminium BEOL interconnect. - Sebastian Orellana; Brice Arrazat; Pascal Fornara; Christian Rivero; Sylvain Blayac; Pierre Montmitonnet; Karim Inal (Microelectron. Reliab., 2015)