Design, integration and characterization of analog integrated circuits: a complete design flow dedicated to microelectronics education. - Jean Tomas; Yann Deval; Pascal Fouillat; E. Ragbi; Jean Paul Dom; J. L. Aucouturier (MSE, 1997)

A New Industrial Approach Compatible With Microelectronics Education: Application to an RF System Design. - Jean Tomas; Yann Deval; Jean-Baptiste Bégueret; Pascal Fouillat; J. L. Aucouturier (MSE, 1999)

Hierarchical Analogue Design and Behavioural Modelling. - Thomas Zimmer; Noëlle Milet-Lewis; Ahmed Fakhfakh; B. Ardouin; Hervé Levi; J. B. Duluc; Pascal Fouillat (MSE, 1999)

Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study. - Yvan Maiden; Barrie W. Jervis; Pascal Fouillat; S. Lesage (IEEE Trans. Instrum. Meas., 1999)

Delay oriented design methodology: application to the design of a VHF low power VLSI polyphase oscillator. - Anne Spataro; Yann Deval; Jean-Baptiste Bégueret; Pascal Fouillat (ICECS, 2000)

An Overview of the Applications of a Pulsed Laser System for SEU Testing. - Vincent Pouget; Pascal Fouillat; Dean Lewis; Hervé Lapuyade; L. Sarger; F. M. Roche; S. Duzellier; R. Ecoffet (IOLTW, 2000)

Toward Analog Circuit Synthesis: A Global Methodology Based upon Design of Experiments. - Yann Deval; Jean-Baptiste Bégueret; Jean Tomas; Pascal Fouillat (SBCCI, 2000)

Clock generator using factorial DLL for video applications. - Jean-Baptiste Bégueret; Yann Deval; Olivier Mazouffre; Anne Spataro; Pascal Fouillat; Eric Benoit; Jean Mendoza (CICC, 2001)

A CMOS VLSI delay oriented waveform converter dedicated to the synthesizer of an UMTS transceiver. - Anne Spataro; Yann Deval; Jean-Baptiste Bigueret; Pascal Fouillat; Didier Belot (CICC, 2001)

Phase error determination in GMSK modulated fractional-N PLL. - L. Camino; Serge Ramet; Jean-Baptiste Bégueret; Yann Deval; Pascal Fouillat (ICECS, 2001)

A New Laser System for X-Rays Flashes Sensitivity Evaluation. - Dean Lewis; Hervé Lapuyade; Yann Deval; Yvan Maidon; Frédéric Darracq; Renaud Briand; Pascal Fouillat (IOLTW, 2001)

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. - Dean Lewis; Vincent Pouget; Thomas Beauchêne; Hervé Lapuyade; Pascal Fouillat; André Touboul; Felix Beaudoin; Philippe Perdu (Microelectron. Reliab., 2001)

Theoretical Investigation of an Equivalent Laser LET. - Vincent Pouget; Hervé Lapuyade; Pascal Fouillat; Dean Lewis; S. Buchner (Microelectron. Reliab., 2001)

A SiGe 4-Gsps 2-bits digitizer with 2-4 GHz input bandwidth. - David Deschans; Jean-Baptiste Bégueret; Yann Deval; Christophe Scarabello; Pascal Fouillat; Guy Montignac; Alain Baudry (ICECS, 2002)

Laser Utilization for Various Testing Purposes. - Pascal Fouillat (LATW, 2002)

Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. - Dean Lewis; Pascal Fouillat; Vincent Pouget (LATW, 2002)

A 4 Gsamples/S with 2-4 GHz Input Bandwidth SIGE Digitizer for Radio Astronomy Applications. - David Deschans; Jean-Baptiste Bégueret; Yann Deval; Christophe Scarabello; Pascal Fouillat; Guy Montignac; Alain Baudry (SBCCI, 2002)

A VLSI CMOS delay oriented waveform converter for polyphase frequency synthesizer. - Anne Spataro; Yann Deval; Jean-Baptiste Bégueret; Pascal Fouillat (IEEE J. Solid State Circuits, 2002)

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Romain Desplats; Pascal Fouillat; Philippe Perdu; Marise Bafleur; David Trémouilles (Microelectron. Reliab., 2003)

A physical approach on SCOBIC investigation in VLSI. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Philippe Perdu; Pascal Fouillat; Yves Danto (Microelectron. Reliab., 2003)

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). - Thomas Beauchêne; David Trémouilles; Dean Lewis; Philippe Perdu; Pascal Fouillat (Microelectron. Reliab., 2003)

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. - Frédéric Darracq; Hervé Lapuyade; Nadine Buard; Pascal Fouillat; R. Dufayel; Thierry Carrière (Microelectron. Reliab., 2003)

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. - Romain Desplats; S. Petit; Sana Rezgui; Carl Carmichael; Pascal Fouillat; Dean Lewis (Microelectron. Reliab., 2004)

Understanding the effects of NIR laser stimulation on NMOS transistor. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2004)

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. - Vincent Pouget; Dean Lewis; Pascal Fouillat (IEEE Trans. Instrum. Meas., 2004)

Electrical Modeling for Laser Testing with Different Pulse Durations. - Alexandre Douin; Vincent Pouget; Dean Lewis; Pascal Fouillat; Philippe Perdu (IOLTS, 2005)

Impact of semiconductors material on IR Laser Stimulation signal. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2005)

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. - Alexandre Douin; Vincent Pouget; M. De Matos; Dean Lewis; Philippe Perdu; Pascal Fouillat (Microelectron. Reliab., 2006)

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. - Vincent Pouget; Alexandre Douin; Gilles Foucard; Paul Peronnard; Dean Lewis; Pascal Fouillat; Raoul Velazco (IOLTS, 2008)

Effect of physical defect on shmoos in CMOS DSM technologies. - Aziz Machouat; Gérald Haller; Vincent Goubier; Dean Lewis; Philippe Perdu; Vincent Pouget; Pascal Fouillat; Fabien Essely (Microelectron. Reliab., 2008)

A CMOS Resizing Methodology for Analog Circuits. - Timothée Levi; Jean Tomas; Noëlle Lewis; Pascal Fouillat (IEEE Des. Test Comput., 2009)