Intelligent Fault Analysis Decision Flow in Semiconductor Industry 4.0 Using Natural Language Processing with Deep Clustering. - Kenneth Ezukwoke; Houari Toubakh; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher; Pascal Gounet (CASE, 2021)

Leveraging Pre-trained Models for Failure Analysis Triplets Generation. - Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher; Pascal Gounet; Jérôme Adrian (CoRR, 2022)

Big GCVAE: decision-making with adaptive transformer model for failure root cause analysis in semiconductor industry. - Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher; Pascal Gounet; Jérôme Adrian (J. Intell. Manuf., 2025)