Lateral confinement of carriers in ultrathin semiconductor quantum wells. - N. Shtinkov; Patrick Desjardins; R. A. Masut (Microelectron. J., 2003)

An Integrated Test Platform for Nanostructure Electrical Characterization. - Olivier Duval; L.-P. Lafrance; Yvon Savaria; Patrick Desjardins (ICMENS, 2004)