Design of a Real Time Geometric Classifier. - Michel Robert; Patrick Gorria; Johel Mitéran; S. Turgis (EDAC-ETC-EUROASIC, 1994)

Classification board for real time image segmentation. - Johel Mitéran; Remy Bailly; Patrick Gorria (ICASSP, 1997)

Active infrared nondestructive testing for glue occlusion detection in plastic cap. - Anne-Claire Legrand; Patrick Gorria; Fabrice Mériaudeau (KES, 2000)

A correlation retina for real-time pattern recognition. - Bernard Lamalle; Guy Cathébras; Lew Fock Chong Lew Yan Voon; Patrick Gorria; Benaissa Bellach; Olivier Aubreton (ETFA (2), 2001)

Optimizing the Factorisation of 2D Filters by Genetic Algorithm. - Eric Fauvet; Lew Fock Chong Lew Yan Voon; Fred Nicolier; Patrick Gorria; Frédéric Truchetet (VIIP, 2001)

Study of the imaging conditions and processing for the aspect control of specular surfaces. - Gaëtan Delcroix; Ralph Seulin; Bernard Lamalle; Patrick Gorria; Fred Merienne (J. Electronic Imaging, 2001)

Machine vision systems in the metallurgy industry. - Anne-Claire Legrand; Pierre Suzeau; Eric Renier; Frédéric Truchetet; Patrick Gorria; Fabrice Mériaudeau (J. Electronic Imaging, 2001)

Detecting parabolas in ultrasound B-scan images with Genetic-Based Inverse Voting Hough Transform. - Khalil Maalmi; A. El-Ouaazizi; Rachid Benslimane; Lew Fock Chong Lew Yan Voon; A. Diou; Patrick Gorria (ICASSP, 2002)

Crack Defect Detection and Localization Using Genetic-Based Inverse Voting Hough Transform. - Khalil Maalmi; A. El-Ouaazizi; Rachid Benslimane; Lew Fock Chong Lew Yan Voon; A. Diou; Patrick Gorria (ICPR (3), 2002)

Simulation of Specular Surface Imaging Based on Computer Graphics: Application on a Vision Inspection System. - Ralph Seulin; Fred Merienne; Patrick Gorria (EURASIP J. Adv. Signal Process., 2002)

Vision system for defect imaging, detection, and characterization on a specular surface of a 3D object. - Denis Aluze; Fred Merienne; Christophe Dumont; Patrick Gorria (Image Vis. Comput., 2002)

Features extraction on complex images. - Pierrick Bourgeat; Fabrice Mériaudeau; Patrick Gorria; Kenneth W. Tobin; Frédéric Truchetet (ICIP, 2004)

Retina for pattern matching in standard 0.6-µm complementary metal oxide semiconductor technology. - Olivier Aubreton; Benaissa Bellach; Lew Fock Chong Lew Yan Voon; Bernard Lamalle; Patrick Gorria; Guy Cathébras (J. Electronic Imaging, 2004)

Content based segmentation of patterned wafers. - Pierrick Bourgeat; Fabrice Mériaudeau; Kenneth W. Tobin; Patrick Gorria (J. Electronic Imaging, 2004)

Active Lighting Applied to Shape from Polarization. - Olivier Morel; Mathias Ferraton; Christophe Stolz; Patrick Gorria (ICIP, 2006)

Automatic texture mapping on real 3D model. - Thierry Molinier; David Fofi; Patrick Gorria; Joaquim Salvi (CVPR, 2007)

3D characterization of hot metallic shells during industrial forging. - Youssef Bokhabrine; Ralph Seulin; Lew Fock Chong Lew Yan Voon; Patrick Gorria; Gouenou Girardin; Miguel Gomez; Daniel Jobard (Mach. Vis. Appl., 2012)