Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. - Yu Wang; Patrick Juliano; Sopan Joshi; Elyse Rosenbaum (Microelectron. Reliab., 2001)

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. - Jie Wu 009; Patrick Juliano; Elyse Rosenbaum (Microelectron. Reliab., 2001)

Measurement, Modeling, and Simulation of Fast Transients in ESD Devices - Patrick Juliano (2001)