Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification. - Benoit Lambert; Jim Thorpe; Reza Behtash; Bernd Schauwecker; Franck Bourgeois; Helmut Jung; Joëlle Bataille; Patrick Mezenge; Cyril Gourdon; Catherine Ollivier; Didier Floriot; Hervé Blanck (Microelectron. Reliab., 2012)