Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Patrick Poirier; David Trémouilles; Marise Bafleur; Dean Lewis (Microelectron. Reliab., 2001)

Comprehensive failure analysis of leakage faults in bipolar transistors. - Bernadette Domengès; P. Schwindenhammer; Patrick Poirier; Felix Beaudoin; Philippe Descamps (Microelectron. Reliab., 2002)

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. - Olivier Crépel; Patrick Poirier; Philippe Descamps; Romain Desplats; Philippe Perdu; Gérald Haller; Abdellatif Firiti (Microelectron. Reliab., 2004)

Isolating failing sites in IC packages using time domain reflectometry: Case studies. - Dolphin Abessolo-Bidzo; Patrick Poirier; Philippe Descamps; Bernadette Domengès (Microelectron. Reliab., 2005)

Dynamic study of the thermal laser stimulation response on advanced technology structures. - Antoine Reverdy; M. de la Bardonnie; Patrick Poirier; H. Murray; Philippe Perdu; A. Boukkali (Microelectron. Reliab., 2008)

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology. - Antoine Reverdy; Philippe Perdu; H. Murray; M. de la Bardonnie; Patrick Poirier (Microelectron. Reliab., 2008)

Determination of temperature change inside IC packages during laser ablation of molding compound. - P. Schwindenhammer; H. Murray; Philippe Descamps; Patrick Poirier (Microelectron. Reliab., 2008)

Fast reliability qualification of SiP products. - Charles Regard; Christian Gautier; Hélène Frémont; Patrick Poirier; Xiaosong Ma; Kaspar M. B. Jansen (Microelectron. Reliab., 2009)