Study of the thermal drift of the offset voltage of silicon pressure sensor. - Ali Boukabache; Gabriel Blasquez; Patrick Pons; Zohir Dibi (ICECS, 1999)

Optimization of a BiCMOS integrated transducer for self-compensated capacitive pressure sensor. - Philippe Ménini; Gabriel Blasquez; Patrick Pons; Cyril Douziech; Patrick Favaro; Philippe Dondon (ICECS, 1999)

Performances and potentialities of a very simple self-compensated pressure sensor demonstrator. - Philippe Ménini; Gabriel Blasquez; Patrick Pons; Xavier Chauffleur; Philippe Dondon; Christian Zardini (IEEE Trans. Instrum. Meas., 1999)

Effect of the silicon membrane flatness defect on the piezoresistive pressure sensor response. - Zohir Dibi; Ali Boukabache; Patrick Pons (ICECS, 2000)

Effect of the membrane flatness defect on the offset voltage of a silicon piezoresistive pressure sensor. - Zohir Dibi; Ali Boukabache; Patrick Pons (ICECS, 2003)

Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling. - Petra Schmitt; Francis Pressecq; Xavier Lafontan; Q.-H. Duong; Patrick Pons; Jean Marc Nicot; Coumar Oudéa; Daniel Estève; Jean-Yves Fourniols; Henri Camon (Microelectron. Reliab., 2003)

Smart MEMS concept for high secure RF and millimeterwave communications. - David Dubuc; M. Saddaoui; S. Mellé; F. Flourens; L. Rabbia; Benoit Ducarouge; Katja Grenier; Patrick Pons; Ali Boukabache; Laurent Bary (Microelectron. Reliab., 2004)

Thermal and electrostatic reliability characterization in RF MEMS switches. - Q.-H. Duong; Lionel Buchaillot; Dominique Collard; Petra Schmitt; Xavier Lafontan; Patrick Pons; F. Flourens; Francis Pressecq (Microelectron. Reliab., 2005)

Investigation of charging mechanisms in metal-insulator-metal structures. - M. A. Exarchos; V. Theonas; Patrick Pons; George J. Papaioannou; S. Mellé; David Dubuc; Fabio Coccetti; Robert Plana (Microelectron. Reliab., 2005)

Biaxial initial stress characterization of bilayer gold RF-switches. - K. Yacine; F. Flourens; David Bourrier; Ludovic Salvagnac; P. Calmont; Xavier Lafontan; Q.-H. Duong; Lionel Buchaillot; D. Peyrou; Patrick Pons (Microelectron. Reliab., 2005)

Charging of radiation induced defects in RF MEMS dielectric films. - M. A. Exarchos; E. Papandreou; Patrick Pons; Mohamed Lamhamdi; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2006)

Charging-Effects in RF capacitive switches influence of insulating layers composition. - Mohamed Lamhamdi; Jean Guastavino; Laurent Boudou; Y. Segui; Patrick Pons; Laurent Bouscayrol; Robert Plana (Microelectron. Reliab., 2006)

Structure dependent charging process in RF MEMS capacitive switches. - E. Papandreou; Mohamed Lamhamdi; C. M. Skoulikidou; Patrick Pons; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2007)

Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches. - A. Belarni; Mohamed Lamhamdi; Patrick Pons; Laurent Boudou; Jean Guastavino; Y. Segui; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. - Mohamed Lamhamdi; Patrick Pons; Usama Zaghloul; Laurent Boudou; Fabio Coccetti; Jean Guastavino; Y. Segui; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

Alpha particle radiation effects in RF MEMS capacitive switches. - Jinyu Jason Ruan; E. Papandreou; Mohamed Lamhamdi; Matroni Koutsoureli; Fabio Coccetti; Patrick Pons; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. - Usama Zaghloul; George J. Papaioannou; Fabio Coccetti; Patrick Pons; Robert Plana (Microelectron. Reliab., 2009)

Miniaturized wireless sensor network - Aubin Lecointre; Daniela Dragomirescu; David Dubuc; Katia Grenier; Patrick Pons; Hervé Aubert; A. Muller; Pascal Berthou; Thierry Gayraud; Robert Plana (CoRR, 2010)

Methods to improve reliability of bulge test technique to extract mechanical properties of thin films. - Hicham Youssef; André Ferrand; Pierre-François Calmon; Patrick Pons; Robert Plana (Microelectron. Reliab., 2010)

Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. - Usama Zaghloul; Matroni Koutsoureli; H. Wang; Fabio Coccetti; George J. Papaioannou; Patrick Pons; Robert Plana (Microelectron. Reliab., 2010)

On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. - Usama Zaghloul; George J. Papaioannou; Bharat Bhushan; Fabio Coccetti; Patrick Pons; Robert Plana (Microelectron. Reliab., 2011)

Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. - Usama Zaghloul; George J. Papaioannou; Bharat Bhushan; Fabio Coccetti; Patrick Pons; Robert Plana (Microelectron. Reliab., 2011)

Wireless sensing and identification of passive electromagnetic sensors based on millimetre-wave FMCW RADAR. - Hervé Aubert; Franck Chebila; Mehdi Jatlaoui; Trang T. Thai; Hamida Hallil; Anya Traille; Sofiene Bouaziz; Ayoub Rifaï; Patrick Pons; Philippe Ménini; Manos M. Tentzeris (RFID-TA, 2012)

Wireless sensing and identification based on radar cross section variability measurement of passive electromagnetic sensors. - Hervé Aubert; Franck Chebila; Mehdi Jatlaoui; Trang T. Thai; Hamida Hallil; Anya Traille; Sofiene Bouaziz; Ayoub Rifaï; Patrick Pons; Philippe Ménini; Manos M. Tentzeris (Ann. des Télécommunications, 2013)

Wireless hydrogen pressure dosimeter for nuclear high dose monitoring. - Emilie Debourg; Julien Philippe; Hervé Aubert; Patrick Pons; Izabela Augustyniak; Pawel Knapkiewicz; Jan A. Dziuban; Michal Matusiak; Michal Olszacki (IEEE SENSORS, 2016)

Wireless pressure measurement in air blast using PVDF sensors. - Jérémie Fourmann; Antony Coustou; Hervé Aubert; Patrick Pons; Jérôme Luc; Alexandre Lefrançois; Maylis Lavayssière; Antoine Osmont (IEEE SENSORS, 2016)

Design and Simulation of a 10 GHz VCO Using an RF MEMS Solenoid Inductor. - Nizar Habbachi; Ali Boukabache; Hatem Boussetta; Patrick Pons; Mohamed Adel Kallala; Kamel Besbes (SSD, 2018)

Modeling of Microfluidically Tuned Capacitor for RF Applications. - Nizar Habbachi; Ali Boukabache; Hatem Boussetta; Patrick Pons; Mohamed Adel Kallala; Kamel Besbes (SSD, 2018)

Radar Imaging Approach for Zero-Power Millimeter-Wave Wireless Sensors. - Dominique Henry; Hervé Aubert; Patrick Pons (RFID-TA, 2019)

In-Situ Wireless Pressure Measurement Using Zero-Power Packaged Microwave Sensors. - Julien Philippe; Maria Valeria De Paolis; Dominique Henry; Alexandre Rumeau; Antony Coustou; Patrick Pons; Hervé Aubert (Sensors, 2019)

Microelectromechanical Transducer to Monitor High-Doses of Nuclear Irradiation. - Julien Philippe; Muriel Ferry; Samuel Charlot; Sandrine Assié; Aurélie Lecestre; Guillaume Libaude; André Ferrand; Patrick Pons; Hervé Aubert (Sensors, 2021)

Frequency Bandwidth of Pressure Sensors Dedicated to Blast Experiments. - Mathieu Chalnot; Patrick Pons; Hervé Aubert (Sensors, 2022)

Transient Response of Miniature Piezoresistive Pressure Sensor Dedicated to Blast Wave Monitoring. - Kevin Sanchez; Bilel Achour; Antony Coustou; Aurélie Lecestre; Samuel Charlot; Maylis Lavayssière; Alexandre Lefrançois; Hervé Aubert; Patrick Pons (Sensors, 2022)

Toward Improvements in Pressure Measurements for Near Free-Field Blast Experiments. - Maylis Lavayssière; Alexandre Lefrançois; Bernard Crabos; Marc Genetier; Maxime Daudy; Sacha Comte; Alan Dufourmentel; Bruno Salsac; Frédéric Sol; Pascal Verdier; Patrick Pons (Sensors, 2023)

Capacitive Effect and Electromagnetic Coupling on Manganin Gauge Limiting the Bandwidth for Pressure Measurements under Shock Conditions. - Antony Coustou; Alexandre Lefrançois; Patrick Pons; Yohan Barbarin (Sensors, 2023)

3-D Printing and Gallium-Based Liquid Metal Technologies for Microwave and Millimeter-Wave Components. - Hervé Aubert; Dominique Henry; Patrick Pons (Proc. IEEE, 2024)