High Test Quality in Low Pin Count Applications. - Jayant D'Souza; Subramanian Mahadevan; Nilanjan Mukherjee 001; Graham Rhodes; Jocelyn Moreau; Thomas Droniou; Paul Armagnat; Damien Sartoretti (ITC, 2008)

Running scan test on three pins: yes we can! - Jocelyn Moreau; Thomas Droniou; Philippe Lebourg; Paul Armagnat (ITC, 2009)

Effective scan chain failure analysis method. - Etienne Auvray; Paul Armagnat; Luc Saury; Maheshwaran Jothi; Michael Brügel (Microelectron. Reliab., 2017)