Formal Fault Injection in Digital Blocks with Mined Assertions. - Damiano Zuccalà; Paul Breuil; Jean-Marc Daveau; Philippe Roche; Katell Morin-Allory (MEMOCODE, 2024)

Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach. - Esther Goudet; Fabio Sureau; Paul Breuil; Luis Peña Treviño; Lirida A. B. Naviner; Jean-Marc Daveau; Philippe Roche (J. Electron. Test., 2024)