Virtual metrology enabled early stage prediction for enhanced control of multi-stage fabrication processes. - Gian Antonio Susto; Adrian B. Johnston; Paul G. O'Hara; Seán F. McLoone (CASE, 2013)

Insight extraction for semiconductor manufacturing processes. - Simone Pampuri; Gian Antonio Susto; Jian Wan 002; Adrian B. Johnston; Paul G. O'Hara; Seán F. McLoone (CASE, 2014)

An adaptive machine learning decision system for flexible predictive maintenance. - Gian Antonio Susto; Jian Wan 002; Simone Pampuri; Mattia Zanon; Adrian B. Johnston; Paul G. O'Hara; Seán F. McLoone (CASE, 2014)