Partial Detectability Profiles. - Paul G. Ryan; W. Kent Fuchs (ICCAD, 1990)

Two-Stage Fault Location. - Paul G. Ryan; Shishpal Rawat; W. Kent Fuchs (ITC, 1991)

Automated diagnosis of VLSI failures. - Paul G. Ryan; Shishpal Rawat; W. Kent Fuchs (VTS, 1991)

Fault dictionary compression and equivalence class computation for sequential circuits. - Paul G. Ryan; W. Kent Fuchs; Irith Pomeranz (ICCAD, 1993)

Logical Diagnosis Solutions Must Drive Yield Improvement. - Paul G. Ryan (ITC, 1997)

Dynamic fault dictionaries and two-stage fault isolation. - Paul G. Ryan; W. Kent Fuchs (IEEE Trans. Very Large Scale Integr. Syst., 1998)

Delay Defect Characteristics and Testing Strategies. - Kee Sup Kim; Subhasish Mitra; Paul G. Ryan (IEEE Des. Test Comput., 2003)

Process defect trends and strategic test gaps. - Paul G. Ryan; Irfan Aziz; William B. Howell; Teresa K. Janczak; Davia J. Lu (ITC, 2014)

Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? - Jacob A. Abraham; Xinli Gu; Teresa MacLaurin; Janusz Rajski; Paul G. Ryan; Dimitris Gizopoulos; Matteo Sonza Reorda (VTS, 2014)