Self-Testing of Multichip Logic Modules. - Paul H. Bardell; William H. McAnney (ITC, 1982)

Parallel Pseudorandom Sequences for Built-In Test. - Paul H. Bardell; William H. McAnney (ITC, 1984)

Random Testing for Stuck-At Storage Cells in an Embedded Memory. - William H. McAnney; Paul H. Bardell; V. P. Gupta (ITC, 1984)

On Random Pattern Test Length. - Jacob Savir; Paul H. Bardell (IEEE Trans. Computers, 1984)

Random Pattern Testability. - Jacob Savir; Gary S. Ditlow; Paul H. Bardell (IEEE Trans. Computers, 1984)

Self-Test of Random Access Memories. - Paul H. Bardell; William H. McAnney (ITC, 1985)

Pseudorandom Arrays for Built-In Tests. - Paul H. Bardell; William H. McAnney (IEEE Trans. Computers, 1986)

TTTC 10th Anniversary. - Paul H. Bardell (IEEE Des. Test, 1987)

Built-in test for RAMs. - Paul H. Bardell; William H. McAnney (IEEE Des. Test, 1988)

Analysis of cellular automata used as pseudorandom pattern generators. - Paul H. Bardell (ITC, 1990)

Design considerations for Parallel pseudoRandom Pattern Generators. - Paul H. Bardell (J. Electron. Test., 1990)

Production Experience with Built-In Self-Test in the IBM ES/9000 System. - Paul H. Bardell; Michael J. Lapointe (ITC, 1991)

Partitioning of polynomial tasks: test generation, an example. - Jacob Savir; Paul H. Bardell (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991)

Discrete logarithms a parallel pseudorandom pattern generator analysis method. - Paul H. Bardell (J. Electron. Test., 1992)

Primitive polynomials of degree 301 through 500. - Paul H. Bardell (J. Electron. Test., 1992)

Calculating the effects of linear dependencies in m-sequences used as test stimuli. - Paul H. Bardell (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

Built-In Self-Test: Milestones and Challenges. - Jacob Savir; Paul H. Bardell (VLSI Design, 1993)