Combined analytical and empirical learning framework for branch and bound algorithms: the knapsack problem. - Matthew J. Realff; Paul H. Kvam; W. E. Taylor (Artif. Intell. Eng., 1999)

Discussion. - Paul H. Kvam; Eric P. Kvam (Technometrics, 1999)

Common cause failure prediction using data mapping. - Paul H. Kvam; J. Glenn Miller (Reliab. Eng. Syst. Saf., 2002)

A Nonlinear Random-Coefficients Model for Degradation Testing. - Suk Joo Bae; Paul H. Kvam (Technometrics, 2004)

Reliability Modeling in Spatially Distributed Logistics Systems. - Ni Wang; Jye-Chyi Lu; Paul H. Kvam (IEEE Trans. Reliab., 2006)

Degradation models and implied lifetime distributions. - Suk Joo Bae; Way Kuo; Paul H. Kvam (Reliab. Eng. Syst. Saf., 2007)

Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. - Suk Joo Bae; Seong-Joon Kim; Way Kuo; Paul H. Kvam (IEEE Trans. Reliab., 2007)

Length Bias in the Measurements of Carbon Nanotubes. - Paul H. Kvam (Technometrics, 2008)

Multi-cause degradation path model: a case study on rubidium lamp degradation. - Sun Quan; Paul H. Kvam (Qual. Reliab. Eng. Int., 2011)

A Probability Model for Strategic Bidding on "The Price Is Right". - Paul H. Kvam (Decis. Anal., 2018)

Mixed-Effects Nonhomogeneous Poisson Process Model for Multiple Repairable Systems. - Byeong Min Mun; Paul H. Kvam; Suk Joo Bae (IEEE Access, 2021)