Simulation and generation of IDDQ tests for bridging faults in combinational circuits. - Sreejit Chakravarty; Paul J. Thadikaran (VTS, 1993)

A Study of IDDQ Subset Selection Algorithms for Bridging Faults. - Sreejit Chakravarty; Paul J. Thadikaran (ITC, 1994)

Fault Simulation ofIDDQ Tests for Bridging Faults in Sequential Circuits. - Paul J. Thadikaran; Sreejit Chakravarty; Janak H. Patel (FTCS, 1995)

Fast Algorithms for Computer IDDQ Tests for Combination Circuits. - Paul J. Thadikaran; Sreejit Chakravarty (VLSI Design, 1996)

Algorithms to select IDDQ measurement points to detect bridging faults. - Sreejit Chakravarty; Paul J. Thadikaran (J. Electron. Test., 1996)

Simulation and Generation of IDDQ Tests for Bridging Faults in Combinational Circuits. - Sreejit Chakravarty; Paul J. Thadikaran (IEEE Trans. Computers, 1996)

Algorithms to compute bridging fault coverage of IDDQ test sets. - Paul J. Thadikaran; Sreejit Chakravarty; Janak H. Patel (ACM Trans. Design Autom. Electr. Syst., 1997)

Novel ATPG algorithms for transition faults. - Xiao Liu 010; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran (ETW, 2002)

Techniques to Reduce Data Volume and Application Time for Transition Test. - Xiao Liu 010; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran (ITC, 2002)

Extraction Error Diagnosis and Correction in High-Performance Designs. - Yu-Shen Yang; Jiang Brandon Liu; Paul J. Thadikaran; Andreas G. Veneris (ITC, 2003)

Extraction Error Analysis, Diagnosis and Correction in Custom-Made High-Performance Designs. - Yu-Shen Yang; Jiang Brandon Liu; Paul J. Thadikaran; Andreas G. Veneris (MTV, 2003)

Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors. - Xiao Liu 010; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran (J. Electron. Test., 2003)

Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application. - Debashis Nayak; Srikanth Venkataraman; Paul J. Thadikaran (VTS, 2004)

Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs. - Yu-Shen Yang; Andreas G. Veneris; Paul J. Thadikaran; Srikanth Venkataraman (DATE, 2005)

Efficient techniques for transition testing. - Xiao Liu 010; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran (ACM Trans. Design Autom. Electr. Syst., 2005)

Design Challenges for High Performance Nano-Technology. - Goutam Debnath; Paul J. Thadikaran (VLSI Design, 2006)

Extraction error modeling and automated model debugging in high-performance custom designs. - Yu-Shen Yang; Andreas G. Veneris; Paul J. Thadikaran; Srikanth Venkataraman (IEEE Trans. Very Large Scale Integr. Syst., 2006)

Design for Manufacturability and Reliability in Nano Era. - Goutam Debnath; Paul J. Thadikaran (VLSI Design, 2009)