Efficiency of Transient Bit-Flips Detection by Software Means: A Complete Study. - Bogdan Nicolescu; Paul Peronnard; Raoul Velazco; Yvon Savaria (DFT, 2003)

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. - Vincent Pouget; Alexandre Douin; Gilles Foucard; Paul Peronnard; Dean Lewis; Pascal Fouillat; Raoul Velazco (IOLTS, 2008)

A generic platform for remote accelerated tests and high altitude SEU experiments on advanced ICs: Correlation with MUSCA SEP3 calculations. - Guillaume Hubert; Raoul Velazco; Paul Peronnard (IOLTS, 2009)

Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions. - Gilles Foucard; Paul Peronnard; Raoul Velazco (J. Electron. Test., 2011)