Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression. - Paul Theo Gonciari; Bashir M. Al-Hashimi; Nicola Nicolici (DATE, 2002)

Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. - Paul Theo Gonciari; Bashir M. Al-Hashimi; Nicola Nicolici (ITC, 2002)

Useless Memory Allocation in System-on-a-Chip Test: Problems and Solutions. - Paul Theo Gonciari; Bashir M. Al-Hashimi; Nicola Nicolici (VTS, 2002)

Test Data Compression: The System Integrator's Perspective. - Paul Theo Gonciari; Bashir M. Al-Hashimi; Nicola Nicolici (DATE, 2003)

Variable-length input Huffman coding for system-on-a-chip test. - Paul Theo Gonciari; Bashir M. Al-Hashimi; Nicola Nicolici (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003)

Addressing useless test data in core-based system-on-a-chip test. - Paul Theo Gonciari; Bashir M. Al-Hashimi; Nicola Nicolici (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003)

A compression-driven test access mechanism design approach. - Paul Theo Gonciari; Bashir M. Al-Hashimi (ETS, 2004)

Synchronization overhead in SOC compressed test. - Paul Theo Gonciari; Bashir M. Al-Hashimi; Nicola Nicolici (IEEE Trans. Very Large Scale Integr. Syst., 2005)