Robustness of MW-Level IGBT modules against gate oscillations under short circuit events. - Paula Diaz Reigosa; Rui Wu; Francesco Iannuzzo; Frede Blaabjerg (Microelectron. Reliab., 2015)

Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview. - Haoze Luo; Francesco Iannuzzo; Paula Diaz Reigosa; Frede Blaabjerg; Wuhua Li; Xiangning He (Microelectron. Reliab., 2016)

Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT. - Paula Diaz Reigosa; Daniel Prindle; Gontran Pâques; Silvan Geissmann; Francesco Iannuzzo; Arnost Kopta; Munaf Rahimo (Microelectron. Reliab., 2016)

Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions. - Lorenzo Ceccarelli; Paula Diaz Reigosa; Amir Sajjad Bahman; Francesco Iannuzzo; Frede Blaabjerg (IECON, 2017)

A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis. - Lorenzo Ceccarelli; Paula Diaz Reigosa; Francesco Iannuzzo; Frede Blaabjerg (Microelectron. Reliab., 2017)

Capacitive effects in IGBTs limiting their reliability under short circuit. - Paula Diaz Reigosa; Francesco Iannuzzo; Munaf Rahimo; Frede Blaabjerg (Microelectron. Reliab., 2017)

Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions. - Mohsen Akbari; Amir Sajjad Bahman; Paula Diaz Reigosa; Francesco Iannuzzo; Mohammad Tavakoli Bina (Microelectron. Reliab., 2018)

Impact of meteorological variations on the lifetime of grid-connected PV inverters. - E. M. S. Brito; Allan Fagner Cupertino; Paula Diaz Reigosa; Yongheng Yang; Victor Flores Mendes; Heverton Augusto Pereira (Microelectron. Reliab., 2018)

Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules. - H. Du; Paula Diaz Reigosa; Francesco Iannuzzo; Lorenzo Ceccarelli (Microelectron. Reliab., 2018)

On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. - Haoze Luo; Paula Diaz Reigosa; Francesco Iannuzzo; Frede Blaabjerg (Microelectron. Reliab., 2018)

Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs. - Paula Diaz Reigosa; Francesco Iannuzzo; Lorenzo Ceccarelli (Microelectron. Reliab., 2018)