Exploring Fault Tolerance to Ionizing Radiation in Severe Environments: Power Transistors with Distinct Layouts. - Paulo R. Garcia; Guilherme I Grandesi; Alexis C. Vilas Bôas; Renato C. Giacomini; Nilberto H. Medina; Luis Eduardo Seixas Jr.; Marcilei Aparecida Guazzelli (LASCAS, 2025)