Electrical characterization of process induced effects on non-silicon devices. - Chadwin D. Young; Pavel Bolshakov; Rodolfo A. Rodriguez-Davila; Peng Zhao; Ava Khosravi; Israel Mejia; Manuel Quevedo-Lopez; Christopher L. Hinkle; Robert M. Wallace (ICICDT, 2018)

Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric. - Pavel Bolshakov; Rodolfo A. Rodriguez-Davila; Manuel Quevedo-Lopez; Chadwin D. Young (IRPS, 2019)