Transient thermo-reflectance measurements of the thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon. - Pavel L. Komarov; Mihai G. Burzo; Gunhan Kaytaz; Peter E. Raad (Microelectron. J., 2003)

Thermal characterization of embedded electronic features by an integrated system of CCD thermography and self-adaptive numerical modeling. - Peter E. Raad; Pavel L. Komarov; Mihai G. Burzo (Microelectron. J., 2008)

Thermoreflectance temperature measurements for optically emitting devices. - Peter E. Raad; Pavel L. Komarov; Mauro A. Bettiati (Microelectron. J., 2014)

Thermal Performance Improvement of GaN-on-Diamond High Electron Mobility Transistors. - Marko J. Tadjer; Travis J. Anderson; James C. Gallagher; Peter E. Raad; Pavel L. Komarov; Andrew D. Koehler; Karl D. Hobart; Fritz J. Kub (DRC, 2018)