Trap Density Modulation for IO FinFET NBTI Improvement. - Rakesh Ranjan; Charles B. LaRow; Ki-Don Lee; Minhyo Kang; Pavitra R. Perepa; Md. Shahriar Rahman; Bong Ki Lee; David Moreau; Carolyn Cariss-Daniels; Timothy Basford; Colby Callahan; Maihan Nguyen; et al. (IRPS, 2020)

Systematic Study of Process Impact on FinFET Reliability. - Rakesh Ranjan; Ki-Don Lee; Md Iqbal Mahmud; Mohammad Shahriar Rahman; Pavitra Ramadevi Perepa; Charles Briscoe LaRow; Caleb Dongkyun Kwon; Maihan Nguyen; Minhyo Kang; Ashish Kumar Jha 005; Ahmed Shariq; Shamas Musthafa Ummer; et al. (IRPS, 2021)

Reverse Body Bias Dependence of HCI Reliability in Advanced FinFET. - Md Iqbal Mahmud; Rakesh Ranjan; Ki-Don Lee; Pavitra Ramadevi Perepa; Caleb Dongkyun Kwon; Seungjin Choo; Kihyun Choi (IRPS, 2022)

Impact of Barrier Metal Thickness on SRAM Reliability. - Rakesh Ranjan; Pavitra Ramadevi Perepa; Ki-Don Lee; Hokyung Park; Peter Kim; Ganesh Chakravarthy Yerubandi; Jon Haefner; Caleb Dongkyun Kwon; Minjung Jin; Wenhao Zhou; Hyewon Shim; Shin-Young Chung (IRPS, 2023)

A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation. - Rakesh Ranjan; Pavitra R. Perepa; Ki-Don Lee; Ashish Kumar Jha 005; Kartika Chandra Sahoo; Kayla N. Sanders; Robert Moeller; Prateek Sharma; Minhyo Kang; Peter Kim; Kwanjae Song; Yongwoo Jeon; et al. (IRPS, 2024)

Impact of Bi-Layer Gate Stack and Thickness on Low Frequency TDDB in FinFET and Planar Devices. - Kartika Chandra Sahoo; Rakesh Ranjan; Ki-Don Lee; Junehwan Jonathan Kim; Robert Moeller; Pavitra Ramadevi Perepa; John A. Frerich; Ju Kwang Kim; Dung Dau; Mukyeng Jung (IRPS, 2025)