Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks. - Viera Stopjaková; Pavol Malosek; Daniel Micusík; Marek Matej; Martin Margala (J. Electron. Test., 2004)

Defect detection in analog and mixed circuits by neural networks using wavelet analysis. - Viera Stopjaková; Pavol Malosek; Marek Matej; Vladislav Nagy; Martin Margala (IEEE Trans. Reliab., 2005)

PCA Data Preprocessing for Neural Network-based Detection of Parametric Defects in Analog IC. - Pavol Malosek; Viera Stopjaková (DDECS, 2006)