A Large Scale Characterization of Device Uptimes. - Mateus Schulz Nogueira; Erica da Cunha Ferreira; Pedro Tubenchlak Boechat; Felipe Assis; Estevão Rabello Ussler; Rafael Rodrigo Furtado do Nascimento; Daniel Sadoc Menasché; Geraldo Xexéo; Abhishek Ramchandran; Katinka Wolter (IEEE Trans. Emerg. Top. Comput., 2023)