Non-robust Test Generation for Crosstalk-Induced Delay Faults. - Pei-Fu Shen; Huawei Li 001; Yong-Jun Xu 001; Xiaowei Li 001 (Asian Test Symposium, 2005)

Robust Test Generation for Precise Crosstalk-induced Path Delay Faults. - Huawei Li 001; Pei-Fu Shen; Xiaowei Li 001 (VTS, 2006)