Investigating user continuance intention toward library self-service technology. - Chorng-Guang Wu; Pei-Yin Wu (Libr. Hi Tech, 2019)

Test Generation for Defect-Based Faults of Scan Flip-Flops. - Yu-Teng Nien; Chen-Hong Li; Pei-Yin Wu; Yung-Jheng Wang; Kai-Chiang Wu; Mango C.-T. Chao (VTS, 2023)