Case study of yield learning through in-house flow of volume diagnosis. - Pei-Ying Hsueh; Shuo-Fen Kuo; Chao-Wen Tzeng; Jih-Nung Lee; Chi-Feng Wu (VLSI-DAT, 2013)

Divide and conquer diagnosis for multiple defects. - Shih-Min Chao; Po-Juei Chen; Jing-Yu Chen; Po-Hao Chen; Ang-Feng Lin; James Chien-Mo Li; Pei-Ying Hsueh; Chun-Yi Kuo; Ying-Yen Chen; Jih-Nung Li (ITC, 2014)

Physical-aware systematic multiple defect diagnosis. - Po-Juei Chen; Chieh-Chih Che; J. C.-M. Li; Shuo-Fen Kuo; Pei-Ying Hsueh; Chun-Yi Kuo; Jih-Nung Lee (IET Comput. Digit. Tech., 2014)