Test pattern generation for multiple stuck-at faults not covered by test patterns for single faults. - Conrad J. Moore; Peikun Wang; Amir Masoud Gharehbaghi; Masahiro Fujita (ISCAS, 2017)

A Hardware Architecture of Particle Swarm Optimization. - Yiqin Lu; Peikun Wang; Jiancheng Qin (J. Comput., 2017)

An ATPG Method for Double Stuck-At Faults by Analyzing Propagation Paths of Single Faults. - Peikun Wang; Conrad J. Moore; Amir Masoud Gharehbaghi; Masahiro Fujita (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults. - Peikun Wang; Amir Masoud Gharehbaghi; Masahiro Fujita (ISQED, 2019)

An Incremental Automatic Test Pattern Generation Method for Multiple Stuck-at Faults. - Peikun Wang; Amir Masoud Gharehbaghi; Masahiro Fujita (VTS, 2019)

A Logic Optimization Method by Eliminating Redundant Multiple Faults from Higher to Lower Cardinality. - Peikun Wang; Amir Masoud Gharehbaghi; Masahiro Fujita (IPSJ Trans. Syst. LSI Des. Methodol., 2020)

An Automatic Test Pattern Generation Method for Multiple Stuck-At Faults by Incrementally Extending the Test Patterns. - Peikun Wang; Amir Masoud Gharehbaghi; Masahiro Fujita (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)