Performance and reliability of asymmetric LDD devices and logic gates. - Jone F. Chen; Jiang Tao; Peng Fang 006; Chenming Hu (CICC, 1998)

Design in hot-carrier reliability for high performance logic applications. - Peng Fang 006; Jiang Tao; Jone F. Chen; Chenming Hu (CICC, 1998)

Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates. - Jone F. Chen; Jiang Tao; Peng Fang 006; Chenming Hu (IEEE J. Solid State Circuits, 1999)