MI-YOLO: more information based YOLO for insulator defect detection. - Shengyang Luan; Chunlei Li; Peng Xu 050; Yaokun Huang; Xiaoyan Wang (J. Electronic Imaging, 2023)

MIA-GAN: More-Information-Assisted GAN for Channel Estimation of Massive MIMO Systems With One-Bit ADCs and Inadequate Samples. - Shengyang Luan; Yongqi Peng; Chunlei Li; Zihan Zhou; Xiaohan Ni; Peng Xu 050 (IEEE Trans. Veh. Technol., 2025)