Analysis of deep level defects in bipolar junction transistors irradiated by 2 MeV electrons. - Yao Ma; Pengfei Xu 012; Mingyue Guan; Filippo Boi; Gao Bo; Min Gong; Xue Wu; Yuxin Wang; Hua Wang; ZengQiang Niao (Microelectron. Reliab., 2017)