Knowledge augmented broad learning system for computer vision based mixed-type defect detection in semiconductor manufacturing. - Junliang Wang; Pengjie Gao; Jie Zhang 041; Chao Lu; Bo Shen (Robotics Comput. Integr. Manuf., 2023)

AKGNN-PC: An assembly knowledge graph neural network model with predictive value calibration module for refrigeration compressor performance prediction with assembly error propagation and data imbalance scenarios. - Qiuhao Xu; Pengjie Gao; Junliang Wang; Jie Zhang 041; Andrew W. H. Ip; Chris W. J. Zhang (Adv. Eng. Informatics, 2024)