Current ratios: a self-scaling technique for production I_DDQ testing. - Peter C. Maxwell; Pete O'Neill; Robert C. Aitken; Ronald Dudley; Neal Jaarsma; Minh Quach; Don Wiseman (ITC, 1999)

Current ratios: a self-scaling technique for production IDDQ testing. - Peter C. Maxwell; Pete O'Neill; Robert C. Aitken; Ronald Dudley; Neal Jaarsma; Minh Quach; Don Wiseman (ITC, 2000)

Reliability Beyond GHz. - Pete O'Neill; Ron Richmond; Mike Tripp; Barbara Vasquez; Art Wager; Zeev Weinberg (VTS, 2001)

Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. - Minh Quach; Tuan Pham; Tim Figal; Bob Kopitzke; Pete O'Neill (ITC, 2002)