Oxide reliability: influence of interface roughness, structure layout, and depletion layer formation. - Bakuri Lanchava; Peter Baumgartner 005; Andreas Martin; Armand Beyer; Erich Mueller (Microelectron. Reliab., 2001)

Reduction of VCO phase noise through forward substrate biasing of switched MOSFETs. - Domagoj Siprak; Marc Tiebout; Peter Baumgartner 005 (ESSCIRC, 2008)

Noise Reduction in CMOS Circuits Through Switched Gate and Forward Substrate Bias. - Domagoj Siprak; Marc Tiebout; Nicola Zanolla; Peter Baumgartner 005; Claudio Fiegna (IEEE J. Solid State Circuits, 2009)

Mechanical Band Gap Formation in Anisotropic CMOS Back-End-of-Line Stacks for Monolithic High-Q MEMS Resonator Confinement. - Richard Hudeczek; Peter Baumgartner 005 (ESSDERC, 2021)

Performance Analysis of Resonant-Fin Transistors and Their Application in RF-Circuit Design. - Richard Hudeczek; Ehrentraud Hager; Peter Baumgartner 005; Harald Pretl (IEEE Access, 2022)

Influence of Transistor Compact Model Accuracy on Phase Noise Simulation. - Lukas Schramm; Peter Baumgartner 005; Jasmin Aghassi-Hagmann (PRIME, 2023)

On-Chip Quantization- and Correlation-Robust Jitter Measurement for Low Phase Noise and High Frequency Oscillators. - Lukas Schramm; Peter Baumgartner 005; Jasmin Aghassi-Hagmann (IEEE Trans. Circuits Syst. II Express Briefs, 2023)

Quantization-Robust On-Chip Jitter Measurement Technique for Multiple Local Oscillator Systems. - Lukas Schramm; Peter Baumgartner 005; Jasmin Aghassi-Hagmann (ISCAS, 2024)