Understanding and Addressing the Noise Induced By Electrostatic Discharge in Multiple Power Supply Systems. - Jaesik Lee; Yoonjong Huh; Peter Bendix; Sung-Mo Kang (ICCD, 2001)

Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology. - Jaesik Lee; Yoonjong Huh; Peter Bendix; Sung-Mo Kang (ISCAS (4), 2001)

ESD design rule checker. - Q. Li; Yoonjong Huh; Jau-Wen Chen; Peter Bendix; Sung-Mo Kang (ISCAS (5), 2001)

Full chip ESD design rule checking. - Q. Li; Yoonjong Huh; Jau-Wen Chen; Peter Bendix; Sung-Mo Kang (ISCAS (5), 2001)

Spice Model Quality: Process Development Viewpoint. - Peter Bendix (ISQED, 2001)

A Sum-over-Paths Impulse-Response Moment-Extraction Algorithm for IC-Interconnect Networks: Verification, Coupled RC Lines. - Yannick L. Le Coz; Dhivya Krishna; Dusan M. Petranovic; William M. Loh; Peter Bendix (ICCAD, 2003)

Chip-level charged-device modeling and simulation in CMOS integrated circuits. - Jaesik Lee; Ki-Wook Kim; Yoonjong Huh; Peter Bendix; Sung-Mo Kang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003)

RF distortion analysis with compact MOSFET models. - Peter Bendix; Pat Rakers; P. Wagh; Laurent Lemaitre; Wladek Grabinski; Colin C. McAndrew; Xin Gu; Gennady Gildenblat (CICC, 2004)

Practical aspects of MOS transistor model "accuracy" in modern CMOS technology. - Peter Bendix; Daniel Foty; David Pachura (ICECS, 2004)

Advanced compact models: gateway to modern CMOS design. - Gennady Gildenblat; Colin C. McAndrew; Hailing Wang; Weimin Wu 004; Daniel Foty; Laurent Lemaitre; Peter Bendix (ICECS, 2004)

Prediction of interconnect adjacency distribution: derivation, validation, and applications. - Payman Zarkesh-Ha; Ken Doniger; William Loh; Peter Bendix (SLIP, 2004)

Design of ESD power protection with diode structures for mixed-power supply systems. - Jaesik Lee; Yoonjong Huh; Peter Bendix; Sung-Mo Kang (IEEE J. Solid State Circuits, 2004)

ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. - Yoon Huh; Peter Bendix; Kyungjin Min; Jau-Wen Chen; Ravindra Narayan; Larry D. Johnson; Steven H. Voldman (IWSOC, 2005)