Alternative Descriptions in Line Drawing Analysis. - Peter C. Maxwell (Artif. Intell., 1974)

Incremental Computer Systems. - Peter C. Maxwell; Paul W. Baker; Philip G. McCrea (Aust. Comput. J., 1976)

Correct DDA Register Transfers for Trapezoidal Integration When Solving Nonlinear Equations of the Form y = A yn. - Peter C. Maxwell (IEEE Trans. Computers, 1977)

Comments on "A Floating Point Multiplexed DDA System". - Philip G. McCrea; Peter C. Maxwell; Paul W. Baker (IEEE Trans. Computers, 1978)

Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers. - Peter C. Maxwell (IEEE Trans. Computers, 1988)

The effectiveness of different test sets for PLAs. - Peter C. Maxwell; Hans-Joachim Wunderlich (EURO-DAC, 1990)

The Interaction of Test and Quality. - Peter C. Maxwell (ITC, 1991)

The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? - Peter C. Maxwell; Robert C. Aitken; Vic Johansen; Inshen Chiang (ITC, 1991)

The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? - Peter C. Maxwell; Robert C. Aitken; Vic Johansen; Inshen Chiang (ITC, 1992)

IDDQ testing as a component of a test suite: The need for several fault coverage metrics. - Peter C. Maxwell; Robert C. Aitken (J. Electron. Test., 1992)

Let's Grade ALL the Faults. - Peter C. Maxwell (ITC, 1993)

Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. - Peter C. Maxwell; Robert C. Aitken (ITC, 1993)

Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. - Peter C. Maxwell; Robert C. Aitken (IEEE Des. Test Comput., 1993)

The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. - Peter C. Maxwell; Robert C. Aitken; Leendert M. Huisman (ITC, 1994)

Quality impacts of non-uniform fault coverage. - Peter C. Maxwell (VTS, 1994)

The Many Faces of Test Synthesis. - Peter C. Maxwell (ITC, 1995)

The use of IDDQ testing in low stuck-at coverage situations. - Peter C. Maxwell (VTS, 1995)

Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit. - Peter C. Maxwell (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

IDDQ and AC Scan: The War Against Unmodelled Defects. - Peter C. Maxwell; Robert C. Aitken; Kathleen R. Kollitz; Allen C. Brown (ITC, 1996)

So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. - Phil Nigh; Wayne M. Needham; Kenneth M. Butler; Peter C. Maxwell; Robert C. Aitken; Wojciech Maly (ITC, 1997)

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. - Phil Nigh; Wayne M. Needham; Kenneth M. Butler; Peter C. Maxwell; Robert C. Aitken (VTS, 1997)

Estimation of defect-free IDDQ in submicron circuits using switch level simulation. - Peter C. Maxwell; Jeff Rearick (ITC, 1998)

CMOS IC reliability indicators and burn-in economics. - Alan W. Righter; Charles F. Hawkins; Jerry M. Soden; Peter C. Maxwell (ITC, 1998)

Best Methods for At-Speed Testing? - Peter C. Maxwell; Steve Baird; Wayne M. Needham; Al Crouch; Phil Nigh (VTS, 1998)

Current ratios: a self-scaling technique for production I_DDQ testing. - Peter C. Maxwell; Pete O'Neill; Robert C. Aitken; Ronald Dudley; Neal Jaarsma; Minh Quach; Don Wiseman (ITC, 1999)

Comparing functional and structural tests. - Peter C. Maxwell; Ismed Hartanto; Lee Bentz (ITC, 2000)

Current ratios: a self-scaling technique for production IDDQ testing. - Peter C. Maxwell; Pete O'Neill; Robert C. Aitken; Ronald Dudley; Neal Jaarsma; Minh Quach; Don Wiseman (ITC, 2000)

Deception by design: fooling ourselves with gate-level models. - Peter C. Maxwell; Jeff Rearick (ITC, 2000)

The Heisenberg Uncertainty of Test. - Peter C. Maxwell (ITC, 2002)

Wafer/Package Test Mix for Optimal Defect Detection. - Peter C. Maxwell (ITC, 2002)

Debating the Future of Burn-In. - Edward J. McCluskey; Subhasish Mitra; Bob Madge; Peter C. Maxwell; Phil Nigh; Mike Rodgers (VTS, 2002)

Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era. - Jaume Segura 001; Peter C. Maxwell (IEEE Des. Test Comput., 2002)

Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. - Peter C. Maxwell (IEEE Des. Test Comput., 2003)

The Design, Implementation and Analysis of Test Experiments. - Peter C. Maxwell (ITC, 2006)

Wafer Level Reliability Screens. - Peter C. Maxwell (ETS, 2007)

Principles and results of some test cost reduction methods for ASICs. - Peter C. Maxwell (ITC, 2007)

Adaptive test directions. - Peter C. Maxwell (ETS, 2010)

Towards Variation-Aware Test Methods. - Ilia Polian; Bernd Becker 001; Sybille Hellebrand; Hans-Joachim Wunderlich; Peter C. Maxwell (ETS, 2011)

Adaptive Testing: Dealing with Process Variability. - Peter C. Maxwell (IEEE Des. Test Comput., 2011)

Adaptive testing: Conquering process variations. - Ender Yilmaz; Sule Ozev; Ozgur Sinanoglu; Peter C. Maxwell (ETS, 2012)

Cell-aware diagnosis: Defective inmates exposed in their cells. - Peter C. Maxwell; Friedrich Hapke; Huaxing Tang (ETS, 2016)

ETS 2015 best paper. - Hans-Joachim Wunderlich; Peter C. Maxwell (ETS, 2016)

Bridge over troubled waters: Critical area based pattern generation. - Peter C. Maxwell; Friedrich Hapke; Maija Ryynaenen; Peter Weseloh (ETS, 2017)

Total Critical Area Based Testing. - Friedrich Hapke; Peter C. Maxwell (ITC, 2018)

Defect-Oriented Test: Effectiveness in High Volume Manufacturing. - Friedrich Hapke; Will Howell; Peter C. Maxwell; Edward Brazil; Srikanth Venkataraman; Rudrajit Dutta; Andreas Glowatz; Anja Fast; Janusz Rajski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)