Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors. - Jan Ackaert; Zhichun Wang; Eddy De Backer; P. Colson; Peter Coppens (Microelectron. Reliab., 2001)

Correlation between predicted cause of SRAM failures and in-line defect data. - Peter Coppens; Guido Vanhorebeek; Eddy De Backer (Microelectron. Reliab., 2001)

TLP Characterization of large gate width devices. - Peter Coppens; G. Jenicot; Herman Casier; F. De Pestel; F. Depuydt; N. Martens; Peter Moens (Microelectron. Reliab., 2007)

Distributed Coordination, Transportation & Localisation in Industry 4.0. - Ruben Van Parys; Maarten Verbandt; Marcus Kotzé; Peter Coppens; Jan Swevers; Herman Bruyninckx; Johan Philips; Goele Pipeleers (IPIN, 2018)

Sample Complexity of Data-Driven Stochastic LQR with Multiplicative Uncertainty. - Peter Coppens; Panagiotis Patrinos (CDC, 2020)

Data-driven distributionally robust LQR with multiplicative noise. - Peter Coppens; Mathijs Schuurmans; Panagiotis Patrinos (L4DC, 2020)

Safe learning LQR of linear dynamics with multiplicative noise. - Peter Coppens; Panagiotis Patrinos (CoRR, 2022)

Data-Driven Distributionally Robust MPC for Constrained Stochastic Systems. - Peter Coppens; Panagiotis Patrinos (IEEE Control. Syst. Lett., 2022)

Ordered Risk Minimization: Learning More from Less Data. - Peter Coppens; Panagiotis Patrinos (CDC, 2023)

Provably Stable Learning Control of Linear Dynamics With Multiplicative Noise. - Peter Coppens; Panagiotis Patrinos (IEEE Trans. Autom. Control., 2024)